JPS5698641A - X-ray diffraction device - Google Patents

X-ray diffraction device

Info

Publication number
JPS5698641A
JPS5698641A JP57780A JP57780A JPS5698641A JP S5698641 A JPS5698641 A JP S5698641A JP 57780 A JP57780 A JP 57780A JP 57780 A JP57780 A JP 57780A JP S5698641 A JPS5698641 A JP S5698641A
Authority
JP
Japan
Prior art keywords
stand
counting
psi
specimen
inclination angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57780A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0211101B2 (en]
Inventor
Mitsuhiro Nagayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Original Assignee
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIGAKU DENKI KK, Rigaku Denki Co Ltd filed Critical RIGAKU DENKI KK
Priority to JP57780A priority Critical patent/JPS5698641A/ja
Publication of JPS5698641A publication Critical patent/JPS5698641A/ja
Publication of JPH0211101B2 publication Critical patent/JPH0211101B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57780A 1980-01-09 1980-01-09 X-ray diffraction device Granted JPS5698641A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57780A JPS5698641A (en) 1980-01-09 1980-01-09 X-ray diffraction device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57780A JPS5698641A (en) 1980-01-09 1980-01-09 X-ray diffraction device

Publications (2)

Publication Number Publication Date
JPS5698641A true JPS5698641A (en) 1981-08-08
JPH0211101B2 JPH0211101B2 (en]) 1990-03-12

Family

ID=11477559

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57780A Granted JPS5698641A (en) 1980-01-09 1980-01-09 X-ray diffraction device

Country Status (1)

Country Link
JP (1) JPS5698641A (en])

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62228940A (ja) * 1986-03-29 1987-10-07 Shimadzu Corp 試料振動型ｘ線回折装置
NL1003229C2 (nl) * 1995-05-30 1998-05-27 Shimadzu Corp Röntgendiffractometer.
JP2015190868A (ja) * 2014-03-28 2015-11-02 株式会社島津製作所 Ｘ線測定装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0553911A1 (en) * 1992-01-27 1993-08-04 Koninklijke Philips Electronics N.V. Position-sensitive X-ray analysis

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4866893A (en]) * 1971-12-16 1973-09-13
JPS52116281U (en]) * 1976-02-28 1977-09-03

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4866893A (en]) * 1971-12-16 1973-09-13
JPS52116281U (en]) * 1976-02-28 1977-09-03

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62228940A (ja) * 1986-03-29 1987-10-07 Shimadzu Corp 試料振動型ｘ線回折装置
NL1003229C2 (nl) * 1995-05-30 1998-05-27 Shimadzu Corp Röntgendiffractometer.
JP2015190868A (ja) * 2014-03-28 2015-11-02 株式会社島津製作所 Ｘ線測定装置

Also Published As

Publication number Publication date
JPH0211101B2 (en]) 1990-03-12

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